DocumentCode :
3502203
Title :
Electroless plating copper cones on leadframe to improve the adhesion with epoxy molding compound
Author :
Wenjing Zhang ; Qin Lu ; Tao Hang ; Ming Li ; Dali Mao
Author_Institution :
State Key Lab. of Metal Matrix Composites, Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
259
Lastpage :
263
Abstract :
A simple method to increase the adhesion strength between leadframe and epoxy molding compound (EMC) was reported in this paper. Cone-structured copper film was deposited on copper-based leadframe sheets by electroless plating. SEM observation of the as-prepared film indicates that cone size distinctly depends on plating time. Adhesion strength between EMC and cone-coated leadframe was measured by button shear test (BST). Results show that when deposition time t≤120s, the adhesion strength increases rapidly with the growth of copper cones, when t >120s, although cones keep growing, the adhesion strength tends to level off. Average adhesion strength reaches maximum value of 33.80(±1.74) MPa, increased by 87% (57%~124%) when substrate was plated for 600s, compared with that of conventional leadframe. By observing leadframe side of fracture surface after destructive button shear test, two failure modes were proposed: failure at interface and inside EMC. It is assumed that the copper nano-cones structure could effectively increase the contact area of EMC and leadframe, which leads to mechanical interlocking. Such micro-nano structure and its unique property are expected to be applied in the practical industry.
Keywords :
adhesion; copper; electroplating; integrated circuit packaging; moulding; scanning electron microscopy; EMC; SEM observation; adhesion strength; as-prepared film; button shear test; cone-coated leadframe; cone-structured copper film; copper nanocone structure; copper-based leadframe sheets; destructive button shear test; electroless plating copper cones; epoxy molding compound; integrated circuit package industry; leadframe; mechanical interlocking; micronano structure; Abstracts; Compounds; Electromagnetic compatibility; Lead; Substrates; Surface cracks; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474613
Filename :
6474613
Link To Document :
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