DocumentCode :
3502563
Title :
Experimental measurement of capacity vs. bit error rate for photorefractive holographic storage
Author :
Burr, G.W.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
24
Abstract :
Summary form only given. At the maximum capacity of a volume holographic storage, the next hologram would push the bit error rate (BER) over specification. The two effects that tend to increase BER as additional holograms are superimposed are interpage cross talk and the finite dynamic range (a decrease in diffraction efficiency per hologram in the presence of a constant noise floor). In the 90 geometry, the latter effect is dominant. There are other noise sources, however, that tend to be either independent of the number of holograms or dependent on the total optical exposure of the crystal. Examples of the former might be nonuniformities in the stored data page; of the latter, noise gratings and the photovoltaic noise buildup empirically observed in LiNbO/sub 3/:Fe.
Keywords :
holographic gratings; holographic storage; iron; lithium compounds; optical noise; photorefractive materials; photovoltaic effects; LiNbO/sub 3/:Fe; additional holograms; bit error rate; constant noise floor; diffraction efficiency; finite dynamic range; interpage cross talk; noise gratings; noise sources; photorefractive holographic storage capacity; photovoltaic noise buildup; stored data page; total optical exposure; volume holographic storage; Bit error rate; Dynamic range; Geometrical optics; Gratings; Holographic optical components; Holography; Optical diffraction; Optical noise; Photovoltaic systems; Solar power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
Type :
conf
DOI :
10.1109/CLEO.1998.675813
Filename :
675813
Link To Document :
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