DocumentCode :
3502713
Title :
Dual-Vt design of FPGAs for subthreshold leakage tolerance
Author :
Kumar, Akhilesh ; Anis, Mohab
Author_Institution :
Dept. of ECE, Waterloo Univ., Ont.
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
740
Abstract :
In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures
Keywords :
circuit CAD; field programmable gate arrays; logic CAD; CAD flow; FPGA; dual-Vt design; logic blocks; subthreshold leakage tolerance; Circuits; Design automation; Field programmable gate arrays; Logic design; MOS devices; Routing; Sleep; Subthreshold current; Switches; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.53
Filename :
1613224
Link To Document :
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