• DocumentCode
    3502958
  • Title

    A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach

  • Author

    Nakazawa, Mitsuru ; Kobayashi, Masakazu ; Toda, Hiroyuki ; Aoki, Yoshimitsu

  • Author_Institution
    Grad. Sch. of Sci. & Technol., Keio Univ., Yokohama, Japan
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    1979
  • Lastpage
    1984
  • Abstract
    In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1 mm3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.
  • Keywords
    deformation; fracture; impurities; nondestructive testing; 3D deformation/fracture characteristics; displacement vectors; impurity particles; load-deformation relationships; microscale internal structures; nanoorder 3D-CT images; nanoscale D/F characteristics; stratified matching approach; Capacitive sensors; Conducting materials; Image analysis; Impurities; Labeling; Materials science and technology; Optical materials; Proposals; Surface cracks; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5414888
  • Filename
    5414888