DocumentCode :
3502958
Title :
A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach
Author :
Nakazawa, Mitsuru ; Kobayashi, Masakazu ; Toda, Hiroyuki ; Aoki, Yoshimitsu
Author_Institution :
Grad. Sch. of Sci. & Technol., Keio Univ., Yokohama, Japan
fYear :
2009
fDate :
3-5 Nov. 2009
Firstpage :
1979
Lastpage :
1984
Abstract :
In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1 mm3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.
Keywords :
deformation; fracture; impurities; nondestructive testing; 3D deformation/fracture characteristics; displacement vectors; impurity particles; load-deformation relationships; microscale internal structures; nanoorder 3D-CT images; nanoscale D/F characteristics; stratified matching approach; Capacitive sensors; Conducting materials; Image analysis; Impurities; Labeling; Materials science and technology; Optical materials; Proposals; Surface cracks; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
ISSN :
1553-572X
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2009.5414888
Filename :
5414888
Link To Document :
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