Title :
The effect of different TSV electroplating levelers on the copper residual stress
Author :
Ciyan Wu ; Xue Feng ; Haiyong Cao ; Huiqin Ling ; Ming Li ; Dali Mao
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Levelers have great influence on residual stress of electrodeposited film used in TSV. In this study, 2-MP (2-mercaptopyridine), JGB (Janus green B) and 2-ABT (2-aminobenzothiazole) are used as levelers to study the effects of different levelers on residual stress. The film stress deposited with different levelers decreases in the order of 2-MP, JGB and 2-ABT and closely related to grain size. Grain size is 15nm, 80nm, 150nm with 2-MP, JGB, 2-ABT respectively. So the larger the grain size, the smaller the tensile stress. Levelers inhibitory decreases in the order of 2-MP, JGB and 2-ABT and higher inhibitory of levelers induce finer grains. Preferred planes change from (200), (111) to (220) with increasing 2-MP and JGB in the solution. The texture coefficient of (220) plane keeps increasing with increasing of 2-ABT concentration. The film surface is rough with 2-MP and JGB as levelers while the surface is smooth with 2-ABT as levelers.
Keywords :
electrodeposits; electroplating; integrated circuit interconnections; integrated circuit packaging; internal stresses; three-dimensional integrated circuits; TSV electroplating levelers; copper residual stress; electrodeposited film; Copper; Films; Grain size; Residual stresses; Surface morphology; Surface topography;
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
DOI :
10.1109/ICEPT-HDP.2012.6474651