DocumentCode :
3503154
Title :
Evaluation of self-magnetically-pinched diodes as high-resolution, high-voltage radiography sources
Author :
Swanekamp, S.B. ; Cooperstein, G. ; Schumer, J.W. ; Mosher, D. ; Young, Frederic ; Ottinger, P.F. ; Commisso, R.J.
Author_Institution :
Titan Corp., Reston, VA, USA
fYear :
2004
fDate :
1-1 July 2004
Firstpage :
206
Abstract :
Summary form only given. The merits of several high-resolution, pulsed-power-driven, radiography sources are examined with numerical simulation for voltages up to 10 MV. The charged particle dynamics in these self-magnetically-pinched diodes, as well as electron scattering and energy loss in the high-atomic-number target, are treated with the particle-in-cell code LSP. High-voltage rod-pinch experiments are performed in negative polarity to maximize the extracted dose. The LSP/CYLTRAN model is used to examine three /spl sim/50 /spl Omega/ negative-polarity diode geometries for voltages up to 10 MV. For a 2-mm-diameter reentrant rod-pinch diode, a forward-directed dose of 740 rad (LiF) at one meter in a 50 ns full-width at half-maximum radiation pulse is predicted. These results indicate that the non-reentrant rod-pinch diode and the planar self-magnetically pinched diode may be attractive pulsed-power-driven radiography sources for voltages of up to 10 MV.
Keywords :
pinch effect; plasma diodes; plasma magnetohydrodynamics; plasma simulation; plasma sources; radiography; 10 MV; 2 mm; 50 ns; 740 rad; LSP/CYLTRAN model; LiF; charged particle dynamics; electron scattering; energy loss; full-width half-maximum radiation pulse; high voltage rod pinch experiments; high-atomic-number target; high-resolution radiography sources; high-voltage radiography sources; negative-polarity diode geometries; nonreentrant rod-pinch diode; numerical simulation; particle-in-cell code; pulsed-power-driver; reentrant rod-pinch diode; self-magnetically-pinched diodes; Diodes; Electrons; Energy loss; Geometry; Numerical simulation; Particle scattering; Predictive models; Radiography; Solid modeling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-8334-6
Type :
conf
DOI :
10.1109/PLASMA.2004.1339793
Filename :
1339793
Link To Document :
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