DocumentCode :
3503247
Title :
Effects of cooling rate on microstructure and microhardness of lead-free Sn-3.0Ag-0.5Cu solder
Author :
Guoqiang Wei ; Lei Wang
Author_Institution :
Sch. of Mech. & Automotive Eng., South China Univ. of Technol., Guangzhou, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
453
Lastpage :
456
Abstract :
The effects of cooling rate on the microstructure and microhardness of Sn-3.0Ag-0.5Cu solder was studied. The results showed that the undercooling of the solder increases with the cooling rate increasing, resulting in eutectic composition shifting to the hypoeutectic region, thus increasing the volume ratio of the primary β-Sn and decreasing its grain size, Simultaneously, Ag3Sn in the eutectic region transforms from the large lamellar-like to uniformly distributed fine granular-like. Due to the grain refinement of the primary β-Sn and dispersion strengthening of the fine Ag3Sn in SAC305 solder, its microhardness markedly increases.
Keywords :
cooling; copper alloys; crystal microstructure; eutectic alloys; microhardness; silver alloys; solders; tin alloys; Sn-Ag-Cu; cooling rate effect; eutectic composition; hypoeutectic region; lead-free solder microhardness; lead-free solder microstructure; Cooling; Electronics packaging; Grain size; Lead; Mechanical factors; Microstructure; cooling rate; lead-free solder; microhardness; microstructure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474657
Filename :
6474657
Link To Document :
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