Title :
Influence of beam uniformity on the transverse emittance of gated field emitter arrays
Author :
Tsujino, S. ; Paraliev, M. ; Helfenstein, P. ; Braun, H.-H.
Author_Institution :
Dept. of Synchrotron Radiat. & Nanotechnol., Paul Scherrer Inst., Villigen-Psi, Switzerland
Abstract :
Transverse emittance of field emission beam generated from single-gate FEAs are experimentally studied. Although as fabricated FEAs exhibit highly granular beam, by applying the Ne-gas conditioning method, uniform FEA beam was realized and its emittance was measured and compared with the previously measured emittance values for granular beams.
Keywords :
electron field emission; beam uniformity; gas conditioning method; gated field emitter arrays; granular beam; single-gate FEA; transverse emittance; Current measurement; Field emitter arrays; Kirk field collapse effect; Logic gates; Particle beams; Pulse measurements; beam uniformity; emittance; field emission;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
DOI :
10.1109/IVNC.2012.6316836
