DocumentCode :
3503340
Title :
Suppressing effect of 1 wt.% nano-TiO2 addition into low Ag content Sn-Ag-Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging
Author :
Tsao, L.C. ; Huang, W.T. ; Wu, M.W. ; Su, Shih-Tang
Author_Institution :
Grad. Inst. of Mater. Eng., Nat. Pingtung Univ. of Sci. & Technol., Neipu, Taiwan
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
465
Lastpage :
468
Abstract :
This study investigated the effects of adding 1 wt.% nano-TiO2 particles into low-Ag content Sn0.35Ag0.7Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 125, 150, and 175°C for up to 7 days. The results indicate that the morphology of the Cu6Sn5 phase transformed from scallop-type to layer-type in low-Ag SAC composite solder/Cu joints. The growth rate of these IMCs increased with the aging temperature and time. Kinetics analyses showed that growth of the overall IMC layers was diffusion controlled. The apparent activation energies for the growth of overall IMC layers are calculated to be 50.62 kJ/mol.
Keywords :
ageing; copper alloys; electronics packaging; silver alloys; solders; tin alloys; IMC; SAC lead-free solder alloys; intermetallic compounds; intermetallic growth; isothermal aging; Abstracts; Aging; Isothermal processes; Kinetic theory; Lead; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474660
Filename :
6474660
Link To Document :
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