Title :
Elimination of artifacts in megavolt X-ray focal-spot diagnosis
Author_Institution :
Rafael, Haifa, Israel
Abstract :
Summary form only given. The focal-spot intensity-distribution is usually measured by imaging an opaque aperture on a 2D position-sensitive detector, and by applying an appropriate decoding algorithm on the image. Crimps, scratches and irregularities in the detector, intensifier or collimator may cause artifacts in the image and consequently may generate erroneous results. While, virtually impossible in other methods, elimination of artifacts is a simple procedure in the square-aperture technique. This is the consequence of the locality of the decoding algorithm. The scheme for recognition and exclusion of artifacts is presented, as well as a detailed demonstration of the focal-spot diagnosis computer program.
Keywords :
X-ray apparatus; X-ray imaging; collimators; image processing; image sensors; 2D position-sensitive detector; artifacts elimination; collimator; decoding algorithm; focal-spot intensity-distribution; intensifier; megavolt X-ray focal-spot diagnosis; opaque aperture; square-aperture technique; Collimators; Decoding; Optical imaging; Particle beam measurements; Particle beams; Particle measurements; Position measurement; Position sensitive particle detectors; Volume measurement; X-ray imaging;
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-8334-6
DOI :
10.1109/PLASMA.2004.1339800