Title :
Development of a Petri net-based fault diagnostic system for industrial processes
Author :
Lee, Jin-Shyan ; Chuang, Chun-Chieh
Author_Institution :
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Abstract :
For the improvement of the reliability and safety of industrial processes, a fault detection and tracing approach has been proposed. In this paper, the P-invariant of Petri nets (PN) is applied to discover sequence faults, while both sensor faults and actuator faults are detected using exclusive logic functions. For industrial applications, the proposed fault detector has been implemented within a programmable logic controller (PLC) by converting the fault detection logic functions into ladder logic diagrams (LLD). Moreover, a fault tracer has been modeled by an AND/OR tree and a tracing procedure is provided to locate the faults. A mark stamping process is demonstrated as an example to illustrate the proposed diagnostic approach.
Keywords :
Petri nets; fault location; manufacturing systems; programmable controllers; reliability; safety; AND/OR tree; P-invariant; Petri net; actuator fault; fault detection; fault diagnostic system; fault location; fault tracing; industrial process; ladder logic diagram; logic function; mark stamping; programmable logic controller; reliability; safety; sensor fault; sequence fault; Actuators; Application software; Discrete event systems; Electrical safety; Fault detection; Logic functions; Manufacturing systems; Monitoring; Petri nets; Programmable control; Fault diagnostic systems; P-invariant; Petri nets (PN); discrete event systems; programmable logic controllers (PLC);
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2009.5414911