• DocumentCode
    3503428
  • Title

    Impatient MRI: Illinois Massively Parallel Acceleration Toolkit for image reconstruction with enhanced throughput in MRI

  • Author

    Wu, Xiao-Long ; Gai, Jiading ; Lam, Fan ; Fu, Maojing ; Haldar, Justin P. ; Zhuo, Yue ; Liang, Zhi-Pei ; Hwu, Wen-Mei ; Sutton, Bradley P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    Much progress has been made in the design of efficient acquisition trajectories for high spatial and temporal resolution in magnetic resonance imaging (MRI). Additionally, significant developments in image reconstruction have enabled the reconstruction of reasonable images from massively undersampled or noisy data that is corrupted by a variety of physical effects, including magnetic field inhomogeneity. Translation of these techniques into clinical imaging has been impeded by the need for expertise and computational facilities to realize the potential of these methods. We present the Illinois Massively Parallel Acceleration Toolkit for Image reconstruction with ENhanced Throughput in MRI (IMPATIENT MRI), a reconstruction utility that enables advanced techniques within clinically relevant computation times by using the computational power available in low-cost graphics processing cards.
  • Keywords
    biomedical MRI; image reconstruction; medical image processing; IMPATIENT MRI; Illinois Massively Parallel Acceleration Toolkit; acquisition trajectories; clinical imaging; enhanced throughput; graphics processing cards; image reconstruction; magnetic field inhomogeneity; Graphics processing unit; Image reconstruction; Kernel; Magnetic resonance imaging; Nonhomogeneous media; Sparse matrices; field inhomogeneity; graphics processing cards; image regularization; magnetic resonance imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872356
  • Filename
    5872356