• DocumentCode
    3503707
  • Title

    Ultrananocrystalline diamond (UNCD) films for field emission-based science and devices

  • Author

    Auciello, Orlando ; Sumant, Anirudha ; Getty, Stephanie ; Glavin, Daniel

  • Author_Institution
    Mater. Sci. Div., Argonne Nat. Lab., Argonne, IL, USA
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Summary form only given. Ultrananocrystalline diamond (UNCD) films developed and patented at Argonne National Laboratory (ANL) exhibit a unique combination of outstanding mechanical, tribological, electrical, thermal, biological and electron field emission properties, which already resulted in industrial components and devices currently commercialized by Advanced Diamond Technologies, a company co-founded by ANL scientists in 2003. UNCD films are synthesized by a novel patented microwave plasma chemical vapor deposition technique using an Ar-rich/CH4 chemistry that produces films with 2-5 nm grains, thus the name UNCD to distinguish them from nanocrystalline diamond films with 30-100 nm grains produced by H-rich/CH4 plasma chemistry. In relation to the topic of this talk, UNCD films can be made electrically conducting via nitrogen incorporation into the grain boundaries (N-UNCD), which introduces states into the bandgap and allow hoping of electrons for conduction and final field emission through the grain boundaries, or by boron doping via substitutional replacement of C atoms in the diamond lattice. In this talk, a review will be presented of the synthesis of N-UNCD films, and studies to understand the mechanism for electron field emission from them, with studies showing that N-UNCD films exhibit low field emission thresholds (~ 2-4 V/μm) with long lifetime emission (~ 1000 hours), with the additional advantages of inherent field enhancement at the nanoscale grain boundaries and low threshold field, even in the presence of residual gases such as O2, in about 10 -4 Torr pressure. The electron field emission performance of N-UNCD fims enable their use as field emitter cathodes for planetary mass spectrometry, specifically, gas-phase ionization of target molecules, in which a low power means of generating an electron beam of the appropriate performance could benefit resource-constrained missions to remote planetary targets th- oughout the Solar System. On the technological side, the N-UNCD field emitters are promissing enough to be used for field emission displays and for massive parallel electron field emission lithography to fabricate ferroelectric nanostructures for the fabrication of the next generation high-density (Gb to Tb) non-volatile ferroelectric memories.
  • Keywords
    cathodes; diamond; ferroelectric materials; ferroelectric storage; field emission displays; field ionisation; grain boundaries; mass spectra; nanofabrication; nanolithography; nanostructured materials; patents; plasma CVD; plasma chemistry; random-access storage; thin film devices; tribology; ANL; Advanced Diamond Technology; Argonne National Laboratory; C; N-UNCD film; biological property; diamond lattice; electrical property; electron beam generation; electron field emission property; ferroelectric nanostructure; field emission display; field emission-based device; field emission-based science; field emitter cathode; gas-phase ionization; massive parallel electron field emission lithography; mechanical property; nanoscale grain boundary; next generation high-density novolatile ferroelectric memories fabrication; patented microwave plasma chemical vapor deposition technique; planetary mass spectrometry; plasma chemistry; remote planetary target; residual gas; resource-constrained mission; size 2 nm to 5 nm; size 30 nm to 100 nm; solar system; target molecule gas-phase ionization; thermal property; tribological property; ultrananocrystalline diamond film; Biology; Diamond-like carbon; Films; Grain boundaries; Laboratories; Mechanical factors; NASA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316856
  • Filename
    6316856