DocumentCode :
3503756
Title :
Optimization of ion-track etching and electrochemical Cu nanocone deposition for field emission cathodes
Author :
Jordan, F. ; Serbun, P. ; Navitski, A. ; Lützenkirchen-Hecht, D. ; Müller, G. ; Alber, I. ; Toimil-Molares, M.E. ; Trautmann, C.
Author_Institution :
FB C Phys. Dept., Univ. of Wuppertal, Wuppertal, Germany
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
We have fabricated patch-structured nanocone (NC) cathodes by using asymmetrically etched ion-track membranes which were metallized and fixed on flat holders. The conical channels of these templates were filled by potentiostatic copper deposition resulting in freestanding Cu-NC of ~ 28 μm length, ~ 3 μm base, and 160-240 nm tip diameter. Fairly homogeneous and well-aligned field emission from all patches was obtained due to the high NC (105 cm-2) and emitter densities (~ 3/patch). Local measurements of selected spots and patches show distinct current jumps at μA levels. SEM images of the processed areas reveal morphological changes proving a successive destruction of single Cu-NCs. Nevertheless, improved current values of ~ 300 μA at reduced fields of 30-50 V/μm have been achieved for the best Cu-NC patches.
Keywords :
copper; electrochemical electrodes; electron field emission; etching; membranes; nanofabrication; nanostructured materials; optimisation; Cu; SEM image processing; conical channel; current jump; electrochemical nanocone deposition; emitter density; field emission cathode; flat holder; ion-track etching optimization; ion-track membrane etching; patch-structured NC cathode fabrication; patch-structured nanocone cathode fabrication; potentiostatic copper deposition; size 160 nm to 240 nm; spot measurement; Cathodes; Copper; Current measurement; Etching; Iron; Materials; Optimization; copper nanocones; current limits; field emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
ISSN :
pending
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/IVNC.2012.6316859
Filename :
6316859
Link To Document :
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