• DocumentCode
    3503847
  • Title

    Fusion of machine intelligence and human intelligence for colonic polyp detection in CT colonography

  • Author

    Wang, Shijun ; Anugu, Vishal ; Nguyen, Tan ; Rose, Natalie ; Burns, Joseph ; McKenna, Matthew ; Petrick, Nicholas ; Summers, Ronald M.

  • Author_Institution
    Imaging Biomarkers & Comput.-Aided Diagnosis Lab., Nat. Institutes of Health Clinical Center, Bethesda, MD, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    160
  • Lastpage
    164
  • Abstract
    In this paper, we proposed a novel method to improve colonic polyp detection in computed tomographic colonography. Utilizing the human knowledge workers via the Amazon Mechanical Turk (MTurk) webservice, we distributed polyp detections from a computer-aided detection system (CAD) to anonymous online knowledge workers and asked them to distinguish true and false polyp candidates. We combined decisions from the CAD system (machine intelligence) and the MTurk workers (human intelligence) using alpha-integration. Preliminary experimental results indicated that the combined decisions were superior to either alone, with area under the receiver operating characteristic curve improving by 5.8% and 7.0% compared with CAD and MTurk workers alone, respectively.
  • Keywords
    Internet; artificial intelligence; computerised tomography; medical computing; sensitivity analysis; Amazon Mechanical Turk webservice; CAD system; alpha-integration; colonic polyp detection; computed tomographic colonography; computer-aided detection system; human intelligence; machine intelligence; online knowledge workers; receiver operating characteristic curve; Colonic polyps; Computed tomography; Design automation; Feature extraction; Humans; Machine intelligence; Training; α -integration; Amazon MTurk; Computed tomographic colonography; classifier fusion; computer aided detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872378
  • Filename
    5872378