DocumentCode :
3503941
Title :
Field emitter technology for nanovision science
Author :
Mimura, Hidenori ; Neo, Yoichiro ; Aoki, Toru ; Yoshida, Tomoya ; Nagao, Masayoshi
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
A field emitter (FE) capable of focusing an electron beam is an attractive device for application, such as ultrafine imaging devices, a scanning electron microscope and electron beam lithography. We have developed multi-gated field emitters such as a quadruple-gated FE with a three-stacked electrode lens and a quintuple-gated FE with a four-stacked electrode lens. Both the FEs can focus the electron beam. However, the quintuple-gated FE has a stronger electron convergence than the quadruple-gated FE, and a beam crossover is clearly observed for the quintuple-gated FE.
Keywords :
electron beam focusing; field emitter arrays; nanoelectronics; beam crossover; electron beam focusing; electron beam lithography; electron convergence; field emitter array; field emitter technology; multigated field emitters; nanovision science; quadruple-gated FE; three-stacked electrode lens; ultrafine imaging devices; Electric potential; Electrodes; Electron beams; Focusing; Iron; Lenses; Logic gates; beam crossover; electron beam; focusing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
ISSN :
pending
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/IVNC.2012.6316867
Filename :
6316867
Link To Document :
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