DocumentCode :
3504110
Title :
Experimental study on the process of cleaning the contacts of signal control relays
Author :
Ohba, Masatoshi ; Kuzukawa, Kiyoaki ; Sakairi, Kohichi
Author_Institution :
Omron Tateisi Electron. Co., Kyoto, Japan
fYear :
1988
fDate :
26-29 Sept. 1988
Firstpage :
311
Lastpage :
320
Abstract :
The authors carried out a study of the effect of organic materials on contact resistance, taking as a typical contamination source paraffin hydrocarbons, which are the most general kind of contact contaminant and are used in the various machines in the manufacturing processes, to clarify the problem of contact reliability caused by contamination by organic materials during the manufacturing process. In addition, the authors also studied conventional methods of contact cleaning as well as cleaning methods that could conceivably be used instead of conventional methods. As a result of this study, it was found that, even when the thickness of organic membranes was around 100 AA, the contact resistance increased along with the passage of time. This trend was particularly prominent at the normally open contact side. The authors also found that alternate methods of removing these organic films, such as CO/sub 2/-laser cleaning, were quite effective.<>
Keywords :
contact resistance; electrical contacts; laser beam applications; maintenance engineering; relays; reliability; surface treatment; ultrasonic applications; CO/sub 2/-laser cleaning; contact contaminant; contact reliability; contact resistance; contamination by organic materials; dry circuit contacts; effect of organic materials; methods of contact cleaning; normally open contact; organic films; organic solvent; paraffin hydrocarbons; process of cleaning; signal control relays; Biomembranes; Cleaning; Contact resistance; Contamination; Manufacturing processes; Materials reliability; Organic materials; Relays; Signal processing; Solvents;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/HOLM.1988.16133
Filename :
16133
Link To Document :
بازگشت