Title :
New Topologies For Field Effect Transistor Models
Author_Institution :
The Ohio State University
Keywords :
Circuit simulation; Circuit topology; Frequency; HEMTs; MODFET circuits; MOSFET circuits; Microwave FETs; Microwave circuits; Parameter extraction; Silicon on insulator technology;
Conference_Titel :
Microwave Conference/Brazil, 1993., SBMO International
Print_ISBN :
0-7803-1288-0
DOI :
10.1109/SBMO.1993.587239