Title :
Model-fitting in the presence of outliers
Author :
Unnikrishnan, Jayakrishnan
Author_Institution :
Audiovisual Commun. Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fDate :
July 31 2011-Aug. 5 2011
Abstract :
We study the problem of parametric model-fitting in a finite alphabet setting. We characterize the weak convergence of the goodness-of-fit statistic with respect to an exponential family when the observations are drawn from some alternate distribution. We then study the effects of outliers on the model-fitting procedure by specializing our results to ∈-contaminated versions of distributions from the exponential family. We characterize the sensitivity of various distributions from the exponential family to outliers, and provide guidelines for choosing thresholds for a goodness-of-fit test that is robust to outliers in the data.
Keywords :
curve fitting; exponential distribution; formal languages; exponential family; finite alphabet setting; goodness-of-fit statistic; parametric model-fitting; Approximation methods; Convergence; Information theory; Maximum likelihood estimation; Robustness; Sensitivity; Testing;
Conference_Titel :
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4577-0596-0
Electronic_ISBN :
2157-8095
DOI :
10.1109/ISIT.2011.6033814