• DocumentCode
    3504168
  • Title

    Automated segmentation of synapses in 3D EM data

  • Author

    Kreshuk, A. ; Straehle, C.N. ; Sommer, C. ; Koethe, U. ; Knott, G. ; Hamprecht, F.A.

  • Author_Institution
    Univ. of Heidelberg, Heidelberg, Germany
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    This contribution presents a method for automatic detection of excitatory, asymmetric synapses and segmentation of synaptic junctional complexes in stacks of serial electron microscopy images with nearly isotropic resolution. The method uses a Random Forest classifier in the space of generic image features, computed directly in the 3D neighborhoods of each pixel, and an additional step of interactive probability maps thresholding. On the test dataset, the algorithm missed considerably less synapses than the human expert during the ground truth creation, while maintaining an equivalent false positive rate. The algorithm is implemented as an extension to the Interactive Learning and Segmentation Toolkit “ilastik” and is freely available on our website (www.ilastik.org/synapse-detection).
  • Keywords
    electron microscopy; image classification; image resolution; image segmentation; learning (artificial intelligence); medical image processing; neurophysiology; probability; 3D EM data; 3D neighborhoods; automated segmentation; equivalent false positive rate; excitatory asymmetric synapses; generic image features; ground truth creation; ilastik; interactive learning; interactive probability maps thresholding; nearly isotropic resolution; random Forest classifier; segmentation toolkit; serial electron microscopy images; synaptic junctional complexes; Feature extraction; Humans; Image segmentation; Microscopy; Pixel; Three dimensional displays; Training; Synapse detection; neural tissue segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872392
  • Filename
    5872392