DocumentCode :
3504396
Title :
A charge sensitive preamplifier for high peak stability in spectroscopic measurements at high counting rates
Author :
Fiorini, Carlo
Author_Institution :
Dipt. di Electron., Politecnico di Milano, Milan, Italy
Volume :
1
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
39
Abstract :
In this work a charge preamplifier designed to achieve high stability in spectroscopic measurements at different counting rates is presented. The preamplifier operates with the input JFET and the feedback capacitor directly integrated on the detector, in the specific case a silicon drift detector (SDD). The motivation of the work is to overcome the peak shift, typically in the order of few percents and then comparable with the energy resolution at 6 keV for a SDD, which can be measured in the present source follower configuration. In the proposed circuit, the SDD anode voltage is stabilized by means of a low-frequency feedback loop which operates according to the ´drain feedback´ technique. Moreover, the implemented design, differently from previous designs also based on the continuous reset of the leakage+signal current, allows to obtain a sufficiently fixed decay time constant of the preamplifier with respect to rate variations. This feature allows to maintain an optimal pole-zero compensation by the shaping amplifier when the event rate changes relevantly during the measurement. In an experimental characterization of the preamplifier with a SDD, a Mn-Kα peak-shift within ±0.03% (i.e. ±2 eV at 6 keV) has been achieved changing the rate from few kcounts/s up to 400 kcounts/s.
Keywords :
X-ray spectroscopy; drift chambers; junction gate field effect transistors; nuclear electronics; preamplifiers; silicon radiation detectors; Mn-Kα peak-shift; SDD anode voltage; charge sensitive preamplifier; decay time constant; drain feedback technique; energy resolution; feedback capacitor; high counting rates; high peak stability; input JFET; leakage-signal current; low-frequency feedback loop; optimal pole-zero compensation; peak shift; shaping amplifier; silicon drift detector; source follower configuration; spectroscopic measurements; Capacitors; Charge measurement; Current measurement; Detectors; Energy resolution; Feedback loop; Preamplifiers; Silicon; Spectroscopy; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462064
Filename :
1462064
Link To Document :
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