DocumentCode :
3504824
Title :
Vertical bent thin-film FEA
Author :
Yoshida, Tomoya ; Nishi, Takashi ; Nagao, Masayoshi
Author_Institution :
Nanoelectron. Res. Inst., Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
We have proposed field-emitter-array fabrication process based on thin-film processes, to fabricate FEA having high compatibility with metal-oxide semiconductor field-effect-transistor and thin film transistor processes. This proposed process was realized using ion-induced bending technique, which can bend thin-film cantilevers to form high aspect ratio structure array. The field electron emission of more than 1 A/cm3 was obtained from our fabricated FEA.
Keywords :
MOSFET; bending; cantilevers; field emitter arrays; thin film transistors; field electron emission; field-emitter-array fabrication process; high aspect ratio structure array; ion-induced bending technique; metal-oxide semiconductor field-effect-transistor; thin film transistor process; thin-film cantilevers; thin-film processes; vertical bent thin-film FEA; Arrays; Fabrication; Films; Logic gates; MOS devices; MOSFET circuits; Thin film transistors; field emitter array; ion induced bending; thin film process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
ISSN :
pending
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/IVNC.2012.6316909
Filename :
6316909
Link To Document :
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