Title :
The fundamental experiments x-ray imaging driven by electron beam
Author :
Neo, Yoichiro ; Suzuki, Ryuji ; Aoki, Toru ; Mmimura, Hidenori
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Abstract :
This report describes about the fundamental experimental results for x-ray imaging device which consists of a Schottky Cadmium Telluride (CdTe) diode and a scanning focused electron beam. It successfully demonstrated that the two kinds ways for reading out signal by electron beam. It was investigated in details about the output current dependencies of intensity and photon energy. 200μm stainless mesh in diameter was also detected by X-ray transmission image.
Keywords :
II-VI semiconductors; Schottky diodes; X-ray imaging; cadmium compounds; electron beams; scanning electron microscopes; CdTe; Schottky cadmium telluride diode; X-ray transmission image; fundamental experiment X-ray imaging device; photon energy; scanning electron beam microscope; scanning focused electron beam; size 200 mum; stainless mesh; Electron beams; Electron tubes; Films; Photonics; Schottky diodes; Substrates; X-ray imaging; CdTe diode; Scanning electron beam microscope; Schottky X-ray; Secondary electron yield;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
DOI :
10.1109/IVNC.2012.6316922
