Title :
Image reconstruction from multiple sensors using stein´s principle. Application to parallel MRI
Author :
Marin, Alexandru ; Chaux, Caroline ; Pesquet, Jean-Christophe ; Ciuciu, Philippe
Author_Institution :
LIGM, Univ. Paris-Est, Marne-la-Vallée, France
fDate :
March 30 2011-April 2 2011
Abstract :
We are interested in image reconstruction when data provided by several sensors are corrupted with a linear operator and an additive white Gaussian noise. This problem is addressed by invoking Stein´s Unbiased Risk Estimate (SURE) techniques. The key advantage of SURE methods is that they do not require prior knowledge about the statistics of the unknown image, while yielding an expression of the Mean Square Error (MSE) only depending on the statistics of the observed data. Hence, they avoid the difficult problem of hyperparameter estimation related to some prior distribution, which traditionally needs to be addressed in variational or Bayesian approaches. Consequently, a SURE approach can be applied by directly parameterizing a wavelet-based estimator and finding the optimal parameters that minimize the MSE estimate in reconstruction problems. Simulations carried out on parallel Magnetic Resonance Imaging (pMRI) images show the improved performance of our method with respect to classical alternatives.
Keywords :
AWGN; Bayes methods; biomedical MRI; image reconstruction; mean square error methods; medical image processing; parameter estimation; variational techniques; wavelet transforms; Bayesian approach; MSE; SURE; Stein Unbiased Risk Estimate; Stein principle; additive white Gaussian noise; hyperparameter estimation; image reconstruction; linear operator; mean square error; multiple sensors; parallel MRI; parallel magnetic resonance imaging; parameter estimation; variational approach; wavelet-based estimator; Context; Estimation; Image reconstruction; Magnetic resonance imaging; PSNR; Sensors; Reconstruction; Stein´s principle; multiple sensors; nonlinear estimation; pMRI; wavelets;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872446