Title :
Multifractal analysis of Resting State Networks in functional MRI
Author :
Ciuciu, Philippe ; Varoquaux, Gaël ; Abry, Patrice ; Almog, Moty
Author_Institution :
LNAO/NeuroSpin, CEA Saclay, Gif-sur-Yvette, France
fDate :
March 30 2011-April 2 2011
Abstract :
It has been know for at least one decade that functional MRI time series display long-memory properties, such as power-law scaling in the frequency spectrum. Concomitantly, multivariate model-free analysis of spatial patterns, such as spatial Independent Component Analysis (sICA), has been successfully used to segment from spontaneous activity Resting-State Networks (RSN) that correspond to known brain function. As recent neuroscientific studies suggest a link between spectral properties of brain activity and cognitive processes, a burning question emerges: can temporal scaling properties offer new markers of brain states encoded in these large scale networks? In this paper, we combine two recent methodologies: group-level canonical ICA for multi-subject segmentation of brain network, and wavelet leader-based multifractal formalism for the analysis of RSN scaling properties. We identify the brain networks that elicit self-similarity or multifractality and explore which spectral properties correspond specifically to known functionally-relevant processes in spontaneous activity.
Keywords :
biomedical MRI; brain; cognition; fractals; image segmentation; independent component analysis; medical image processing; neurophysiology; time series; RSN; brain activity; cognitive process; functional MRI; group-level canonical ICA; large scale networks; multifractal analysis; multisubject segmentation; multivariate model-free analysis; power-law scaling; resting state networks; resting-state networks; self-similarity; spatial independent component analysis; temporal scaling; time series; Brain; Estimation; Fractals; Lead; Noise; Time series analysis; Wavelet analysis; fMRI; multifractality; resting state; scaling; spatial ICA;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872448