Title :
Scaled form for kernel Fowler-Nordheim-type expression based on the Schottky-Nordheim barrier, and test for orthodoxy of field electron emission
Author :
Forbes, Richard G.
Author_Institution :
Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
Abstract :
This conference paper supports an overview presented elsewhere in this conference, by setting out detailed theory about the concept of "kernel current density", and about the development of a simple numerical test for (lack of) emission orthodoxy. The test can be applied to any form of linear (or nearly linear) Fowler-Nordheim plot.
Keywords :
Schottky barriers; current density; electron emission; field emission; Schottky-Nordheim barrier; emission orthodoxy testing; field electron emission; kernel Fowler-Nordheim-type expression; kernel current density; linear Fowler-Nordheim plot; numerical testing; Current density; Electron emission; Equations; Kernel; Mathematical model; Tin; Tunneling; Fowler-Nordheim plot; emission orthodoxy; kernel current density; test of orthodoxy; theory of field electron emission;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
DOI :
10.1109/IVNC.2012.6316934
