DocumentCode :
3505353
Title :
Resolving power of the field electron and field ion imaging processes
Author :
Forbes, Richard G.
Author_Institution :
Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
This conference paper reports the interim conclusions of a re-examination of the theory of the resolving power of the field electron and field ion microscopes. It argues that existing theory contains multiple errors and needs to be completely replaced. Progress made is reported. The nature of problems remaining to be solved is briefly discussed.
Keywords :
electron field emission; field emission electron microscopy; field electron; field ion imaging process; field ion microscopes; Electron microscopy; Image resolution; Iron; Optical microscopy; field electron and ion emission optics; field electron and ion microscopy; resolving power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
ISSN :
pending
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/IVNC.2012.6316936
Filename :
6316936
Link To Document :
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