Title :
Advances in optically-based sampling for diagnostics of microwave digital and analog circuits
Author_Institution :
Center for Ultrafast Opt. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
Aug. 30 1999-Sept. 3 1999
Abstract :
This paper describes how a micromachined, fiber-coupled, freestanding photoconductive probe is fabricated and then implemented to perform high temporal-, spatial-, and voltage-resolution measurements at the interior nodes of integrated circuits. This high-impedance, noninvasive probe has been utilized not only for temporal measurements of clocked microwave-digital ICs and nonlinear microwave circuits, but also to perform swept-frequency internal network measurements of MMICs. It has proven itself to be a valuable resource for isolating faults within circuits and for providing direct results that can be used for validating models and designs.
Keywords :
electro-optical devices; fault diagnosis; integrated circuit measurement; integrated circuit testing; microsensors; microwave integrated circuits; network analysers; photoconducting devices; swept-frequency reflectometry; voltage measurement; JFET source follower; MMIC; circuit diagnostics; clocked circuits; fault isolation; fiber-coupled; freestanding photoconductive probe; high spatial-resolution; high temporal-resolution; high voltage-resolution; high-impedance noninvasive prob; micromachined probe; microwave analog circuits; microwave digital circuits; nonlinear microwave circuits; optically-based sampling; readout circuit; swept-frequency internal network measurements; Clocks; Fiber nonlinear optics; Integrated circuit measurements; Microwave measurements; Nonlinear optics; Performance evaluation; Photoconducting devices; Probes; Sampling methods; Voltage;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location :
Seoul, South Korea
Print_ISBN :
0-7803-5661-6
DOI :
10.1109/CLEOPR.1999.817833
