DocumentCode :
3505431
Title :
Shedding New Light on Merit Factor
Author :
Dai, Xiaoming ; Bai, Yong ; Chen, Lan
Author_Institution :
DoCoMo Beijing Commun. Labs. Co., Ltd., Beijing
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
1776
Lastpage :
1780
Abstract :
The merit factor (MF) introduced by Golay has long been accepted as the standard criterion to evaluate the binary sequence´s anti-multipath property in sonar, radar, and communication systems for its simplicity and seemly infallibility. First we present two binary sequence pairs (of lengths 32 and 64) of identical MFs with great discrepancies between the respective binary sequence pairs´ uncoded symbol-error rate (SER) performance and theoretical analysis (based on the MF) to shed new light on the hitherto unnoticed determining factor of the sequence´s anti-multipath property. We then propose the weighted merit factor (WMF) based on a non-uniform weighting of the out-of-phase aperiodic autocorrelation function (ACF) which leads to better matches between the cited sequence pairs´ analytical and experimental results. Ensuing theoretical analysis demonstrates that the WMF provides optimal measurement of self-generated interference for the constant amplitude complex-valued sequences and the nonconstant modulus ones. The MF is shown to be a biased metric for the binary sequences when the multipath delay spread exceeds one chip period. We conjecture that this conclusion continues to hold true for the constant amplitude complex-valued sequences.
Keywords :
Golay codes; binary sequences; correlation methods; intersymbol interference; multipath channels; Golay codes; WMF; antimultipath property; aperiodic ACF; autocorrelation function; binary sequence; light shedding; self-generated interference measurement; sonar-radar communication system; symbol-error rate; uncoded SER; weighted merit factor; Autocorrelation; Binary sequences; Communication standards; Communication systems; Delay; Interference; Performance analysis; Radar; Semiconductor device measurement; Sonar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
Conference_Location :
Singapore
ISSN :
1550-2252
Print_ISBN :
978-1-4244-1644-8
Electronic_ISBN :
1550-2252
Type :
conf
DOI :
10.1109/VETECS.2008.406
Filename :
4525962
Link To Document :
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