• DocumentCode
    3505431
  • Title

    Shedding New Light on Merit Factor

  • Author

    Dai, Xiaoming ; Bai, Yong ; Chen, Lan

  • Author_Institution
    DoCoMo Beijing Commun. Labs. Co., Ltd., Beijing
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    1776
  • Lastpage
    1780
  • Abstract
    The merit factor (MF) introduced by Golay has long been accepted as the standard criterion to evaluate the binary sequence´s anti-multipath property in sonar, radar, and communication systems for its simplicity and seemly infallibility. First we present two binary sequence pairs (of lengths 32 and 64) of identical MFs with great discrepancies between the respective binary sequence pairs´ uncoded symbol-error rate (SER) performance and theoretical analysis (based on the MF) to shed new light on the hitherto unnoticed determining factor of the sequence´s anti-multipath property. We then propose the weighted merit factor (WMF) based on a non-uniform weighting of the out-of-phase aperiodic autocorrelation function (ACF) which leads to better matches between the cited sequence pairs´ analytical and experimental results. Ensuing theoretical analysis demonstrates that the WMF provides optimal measurement of self-generated interference for the constant amplitude complex-valued sequences and the nonconstant modulus ones. The MF is shown to be a biased metric for the binary sequences when the multipath delay spread exceeds one chip period. We conjecture that this conclusion continues to hold true for the constant amplitude complex-valued sequences.
  • Keywords
    Golay codes; binary sequences; correlation methods; intersymbol interference; multipath channels; Golay codes; WMF; antimultipath property; aperiodic ACF; autocorrelation function; binary sequence; light shedding; self-generated interference measurement; sonar-radar communication system; symbol-error rate; uncoded SER; weighted merit factor; Autocorrelation; Binary sequences; Communication standards; Communication systems; Delay; Interference; Performance analysis; Radar; Semiconductor device measurement; Sonar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.406
  • Filename
    4525962