DocumentCode :
3505524
Title :
Challenges and feasibility of copper wire bonding for non-hermetic packaging
Author :
Jing-en Luan
Author_Institution :
STMicroelectron. Pte Ltd., Shenzhen, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
980
Lastpage :
985
Abstract :
In the last few years copper wire bonding has undergone a tremendous growth period. The drive behind the growth is the huge cost saving for copper wire compared with gold wire especially for those packages or applications with longer wire connection, more IOs or thicker wire. Copper wire has also other advantages like better electrical performance and mechanical performance. Thinner copper wire can have equivalent performance as the thicker gold wire. Many studies have been done on copper wire bonding for equipment capability, robust process window, and package reliability etc. most of those efforts have been put on molded BGA or leadframe packages etc. hermetic packages, where bonding wire is protected by molding compound. However, there is no much study about copper wire bonding for non-hermetic packages like MEMS microphone, camera module etc where the bonding wires are in cavities and not protected or embedded resin materials. Reliability is a great concern for such applications. The work discussed in this paper focuses on copper wire bonding for non-hermetic packaging. Due to its material properties, copper has much narrow process window for wire bonding than gold wire. It makes the copper bonding even challenging for Non-hermetic packages. With huge of work on the proper wire and capillary selection, and process window optimization, it was found that copper wire bonding is feasible for non-hermetic package, and qualified for camera module and OLGA packages. Yield and productivity are equivalent to gold wire.
Keywords :
copper; electronics packaging; lead bonding; reliability; MEMS microphone; OLGA packages; camera module; copper wire bonding; cost saving; electrical performance; equipment capability; gold wire; hermetic packages; leadframe packages; material properties; mechanical performance; molded BGA; molding compound; nonhermetic packaging; package reliability; resin material; robust process window; wire connection; Abstracts; Force; Gold; High temperature superconductors; Lead; Silicon carbide; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474770
Filename :
6474770
Link To Document :
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