• DocumentCode
    3505624
  • Title

    The challenge of grinding technology for TSV and BSI device

  • Author

    Liew Loy Seng

  • Author_Institution
    DISCO HI-TEC CHINA Co., Ltd., Shanghai, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1000
  • Lastpage
    1002
  • Abstract
    The demand from digital mobile industry is pushing the development of smaller, more compact and more effective electronic device likes SiP, RFID and etc in the past few years. For a higher performance and energy saving solution, the development of TSV (Through Silicon Via) package has been sped up for the past few years. In China, the development of TSV and BSI (Backside illumination) technology for high pixel camera module used in the smart phone is progressing rapidly since the past one year. For TSV and BSI device, the requirement of grinding process is different from the normal grinding system used in the backend assembly process. In this paper, the author would like to discuss about the requirement needed in this technology.
  • Keywords
    assembling; cameras; grinding; integrated circuit packaging; lighting; smart phones; three-dimensional integrated circuits; BSI device; RFID; SiP; TSV package; backend assembly process; backside illumination technology; digital mobile industry; electronic device; grinding process; grinding technology; high-pixel camera module; smart phone; through silicon via package; Abstracts; Rough surfaces; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474775
  • Filename
    6474775