DocumentCode
3505624
Title
The challenge of grinding technology for TSV and BSI device
Author
Liew Loy Seng
Author_Institution
DISCO HI-TEC CHINA Co., Ltd., Shanghai, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
1000
Lastpage
1002
Abstract
The demand from digital mobile industry is pushing the development of smaller, more compact and more effective electronic device likes SiP, RFID and etc in the past few years. For a higher performance and energy saving solution, the development of TSV (Through Silicon Via) package has been sped up for the past few years. In China, the development of TSV and BSI (Backside illumination) technology for high pixel camera module used in the smart phone is progressing rapidly since the past one year. For TSV and BSI device, the requirement of grinding process is different from the normal grinding system used in the backend assembly process. In this paper, the author would like to discuss about the requirement needed in this technology.
Keywords
assembling; cameras; grinding; integrated circuit packaging; lighting; smart phones; three-dimensional integrated circuits; BSI device; RFID; SiP; TSV package; backend assembly process; backside illumination technology; digital mobile industry; electronic device; grinding process; grinding technology; high-pixel camera module; smart phone; through silicon via package; Abstracts; Rough surfaces; Surface roughness; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474775
Filename
6474775
Link To Document