• DocumentCode
    3505676
  • Title

    Robust positive-sequence detector algorithm

  • Author

    Neto, João A Moor ; Lovisolo, Lisandro ; França, Bruno W. ; Aredes, Maurício

  • Author_Institution
    DEPEL, CEFET-RJ, Rio de Janeiro, Brazil
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    788
  • Lastpage
    793
  • Abstract
    This paper discusses a new PLL (Phase-Locked-Loop) approach for detection of the fundamental positive-sequence component of three-phase systems. Details about this three-phase PLL structure are provided. The positive sequence detector presented computes inner-products between the input and a locally generated version of the fundamental frequency. The inner-products are used to estimate the phase-angle, frequency and amplitude of the fundamental component. In order to validate the effectiveness of the detection algorithm here discussed, simulations using PSCAD/EMTDC under conditions that are similar to the ones encountered in practical digital implementations are presented, for disturbances and unbalance. The digital implementation of this positive-sequence detector has a fast dynamic response and robust performance under distortion and/or faulty conditions when implemented using a high sampling rate and floating-point precision. For embedding such an algorithm (for example in a DSP) reducing its computational complexity is welcomed. This reduction can be approached in several ways: using fixed-point arithmetic, reducing the sampling rate or avoiding some computations. The impact of down-sampling in the inner products carried out by the algorithm (what reduces the overall computational complexity) in the performance of the algorithm is analyzed. Experimental results using a fixed-point DSP are presented as well.
  • Keywords
    fixed point arithmetic; floating point arithmetic; phase locked loops; EMTDC; PLL approach; PSCAD; fixed-point DSP; floating-point precision; phase-locked-loop approach; robust positive-sequence detector algorithm; three-phase systems; Amplitude estimation; Computational complexity; Detectors; Digital signal processing; Frequency estimation; Phase detection; Phase estimation; Phase locked loops; Robustness; Sampling methods; DSP; Fixed-Point; PLL; Positive-Sequence; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5415020
  • Filename
    5415020