Title :
Efficient FDTD calculation of multi-port S parameters for microstrip and stripline circuits
Author :
Langdon, H.S. ; Luebbers, R.
Author_Institution :
Remcom Inc., State Coll., PA, USA
Abstract :
The finite difference time domain (FDTD) method has been used for the calculation of scattering (S) parameters for a number of years. A difficult problem is separating the interaction between the source excitation and the time domain reflections. In a previous paper Luebbers and Langdon (see IEEE Transactions on Antennas and Propagation, vol.44, no.7, p.1535-9, 1996) presented the idea of a voltage source with an internal source resistance as a means for exciting a microstrip patch antenna. The resistive source feed also allows one to position the feed very close to the structure, thereby reducing the number of cells and computer memory needed. In addition the number of time steps needed can be drastically reduced, especially for a resonant structure. We extend the resistive source approach to the calculation of multiport S parameters. Each FDTD calculation determines one column of the matrix. For example, if port 1 is excited then that calculation provides S/sub 11/, S/sub 21/, "...", S/sub N1/.
Keywords :
S-matrix theory; S-parameters; antenna feeds; electromagnetic wave reflection; finite difference time-domain analysis; microstrip antennas; microstrip circuits; multiport networks; strip line circuits; FDTD calculation; FDTD method; computer memory reduction; feed position; finite difference time domain; internal source resistance; matrix; microstrip circuits; microstrip meander line; microstrip patch antenna; multi-port S parameters; resistive source feed; resonant structure; scattering parameters; source excitation; stripline circuits; time domain reflections; time steps; voltage source; Circuits; Educational institutions; Feeds; Finite difference methods; Microstrip antennas; Patch antennas; Scattering parameters; Stripline; Time domain analysis; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-4178-3
DOI :
10.1109/APS.1997.631696