• DocumentCode
    3505979
  • Title

    Field emission properties of self-structured CNT networks deposited at temperatures below 150°C

  • Author

    Navitski, A. ; Serbun, P. ; Müller, G. ; Shulitski, B. ; Tamashevich, Y. ; Tymoshchyk, A.

  • Author_Institution
    FB C Phys. Dept., Univ. of Wuppertal, Wuppertal, Germany
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Self-structured CNT networks were grown on n-Si substrates using a recently developed CVD process based on a reactor with high and low temperature zones. This CVD process separates the synthesis of CNTs at typically 800°C from their deposition at temperatures below 150°C on cheap substrates like glass and polymer foils. Depending on the various process parameters, self-structuring into well-separated hills of entangled CNT bundles occurs which also show some outgrowth of vertically-oriented single-wall CNTs. These cathodes provide random but well-distributed field emission with around 10000 emitters/cm2 at an electric onset field (for 1 nA) of ~2.5 V/μm. Local measurements of Ø 150 μm spots reproducibly yield stable currents of at least 200 μA and maximum currents up to 1 mA. Integral pulsed measurements of the whole cathodes reveal fairly homogeneous emission resulting in at least 10 mA/cm2 only limited by the heat load on the phosphor screen.
  • Keywords
    carbon nanotubes; cathodes; chemical vapour deposition; electron field emission; polymer films; Si; cathodes; electric onset field; field emission; field emission property; glass; heat load; integral pulsed measurements; phosphor screen; polymer foils; self-structured CNT networks; temperature 800 degC; vertically-oriented single-wall CNT; Carbon nanotubes; Cathodes; Current measurement; Fluid flow; Inductors; Iron; Substrates; carbon nanotube networks; field emission cathodes; low temperature deposition; self-structuring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316967
  • Filename
    6316967