• DocumentCode
    3505983
  • Title

    Analysis of parametrical dependencies of Stoneley wave attenuation in fluid-filled borehole due to its scattering on rough well surface

  • Author

    Podyachev, Evgeny V. ; Maximov, German A. ; Ortega, Elina

  • Author_Institution
    Dept. of Phys. Process Modeling in Environ., Moscow Eng. Phys. Inst.
  • Volume
    0
  • fYear
    2005
  • fDate
    May 28 2005-June 1 2005
  • Firstpage
    216
  • Lastpage
    224
  • Abstract
    The problem on attenuation of Stoneley wave and other highest modes due to their scattering on a well roughness is considered in the report. The solution of problem was obtained in framework of small perturbation approximation and with use of the mean field approach technique. The main goal of the report is the analysis of frequency dependencies of partial attenuation coefficients (corresponding to scattering into eigen modes and bulk waves) for different ratios of correlation length and borehole radius to wavelength and for different correlation functions of roughness. In particular it, is shown that the forward and the backward scattering have different scaling factors that, leads to separation of their contributions to attenuation factor in frequency domain. The useful scaling and normalizing factors are suggested in dependence on form of correlation function
  • Keywords
    acoustic wave absorption; acoustic wave scattering; eigenvalues and eigenfunctions; rough surfaces; surface acoustic wave correlation; surface acoustic waves; Stoneley wave attenuation; backward scattering; borehole radius; bulk waves; eigen modes; fluid-filled borehole; frequency domain; mean field approach technique; parametrical dependencies; partial attenuation coefficients; rough well surface; scattering; small perturbation approximation; Attenuation; Boundary conditions; Frequency domain analysis; Information resources; Mie scattering; Permeability; Physics; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Days on Diffraction, 2005. DD 2005. Proceedings of the International Conference
  • Conference_Location
    St.Petersburg
  • Print_ISBN
    5-9651-0140-6
  • Type

    conf

  • DOI
    10.1109/DD.2005.204896
  • Filename
    1613403