A low cost time resolved spot diagnostic for flash X-ray machines

Summary form only given. AWE has embarked on a programme of work to develop an improved intense electron beam diode for flash X-ray radiography machines. In order to understand the performance of the diode, and to validate computer modeling codes, there is a requirement to obtain time resolved X-ray spot size and position data during the 50 ns electron beam pulse. A simple, low cost, time resolved spot diagnostic is described, based around a number of single frame, fast gating intensified CCD camera modules focussed onto a very fast organic scintillator. Each camera is independently triggered and capable of gate widths down to 2 ns. The complete system is battery driven and controlled remotely via optical fibres to provide electrical isolation and reduce EMP susceptibility. An initial four frame system (easily extendable to 8 frames and beyond) has been developed. Evaluations of the optical and radiological response are described. Time resolved spot size measurements from a number of electron beam diodes fielded upon flash X-ray machines are also reported.