Title :
An efficient automatic testing algorithm for power supplies in electronic systems
Author :
Lee, Tae-Joong ; Kang, Jun-Woo ; Kim, Young-Hwa
Author_Institution :
Dept. of Electron. Eng., Hankok Univ. of Foreign Studies, South Korea
Abstract :
Since power supplies of electronic systems are important parts to operate without stopping, they are checked periodically and replaced when accidental failures are expected. Moreover it is required, in critical applications, to predict when the power supply will fail. Automatic testing equipment (ATE) described in this paper implements algorithms for testing various power supplies. This algorithm is based on the classification of characteristics and testing items of power supplies which have an AC input and DC outputs
Keywords :
automatic test equipment; failure analysis; power supplies to apparatus; AC input; DC output; accidental failures; automatic testing algorithm; electronic systems; power supplies; power supply failure prediction; Automatic control; Automatic testing; Communication system control; Consumer electronics; Control systems; Electronic equipment testing; Power supplies; Protocols; System testing; Voltage control;
Conference_Titel :
TENCON 99. Proceedings of the IEEE Region 10 Conference
Conference_Location :
Cheju Island
Print_ISBN :
0-7803-5739-6
DOI :
10.1109/TENCON.1999.818704