• DocumentCode
    3506075
  • Title

    An efficient automatic testing algorithm for power supplies in electronic systems

  • Author

    Lee, Tae-Joong ; Kang, Jun-Woo ; Kim, Young-Hwa

  • Author_Institution
    Dept. of Electron. Eng., Hankok Univ. of Foreign Studies, South Korea
  • Volume
    2
  • fYear
    1999
  • fDate
    36495
  • Firstpage
    1446
  • Abstract
    Since power supplies of electronic systems are important parts to operate without stopping, they are checked periodically and replaced when accidental failures are expected. Moreover it is required, in critical applications, to predict when the power supply will fail. Automatic testing equipment (ATE) described in this paper implements algorithms for testing various power supplies. This algorithm is based on the classification of characteristics and testing items of power supplies which have an AC input and DC outputs
  • Keywords
    automatic test equipment; failure analysis; power supplies to apparatus; AC input; DC output; accidental failures; automatic testing algorithm; electronic systems; power supplies; power supply failure prediction; Automatic control; Automatic testing; Communication system control; Consumer electronics; Control systems; Electronic equipment testing; Power supplies; Protocols; System testing; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 99. Proceedings of the IEEE Region 10 Conference
  • Conference_Location
    Cheju Island
  • Print_ISBN
    0-7803-5739-6
  • Type

    conf

  • DOI
    10.1109/TENCON.1999.818704
  • Filename
    818704