MCM interconnect test scheme based on particle swarm optimization algorithm

Interconnect test technology has become a bottleneck in the application of Multi-chip Module (MCM), so study on new methods of test generation to acquire better test set is significant. The paper presents a new interconnect test generation scheme based on particle swarm optimization (PSO) algorithm for Multi-chip Module. By combing the characteristics of interconnect test, this paper proposed the velocity updating equation and position updating equation of discrete particles swarm optimization for automatic test generation. The international standard MCM benchmark circuit was used to verify the approach. Comparing with not only the evolutionary algorithms, but also the deterministic algorithms, simulation results indicate that this optimization approach can achieve high fault coverage, compact test set and short execution time.