Title :
Reliability experiment of high power cm-bar arrays
Author :
Guo-guang Lu ; Zhi-Feng Lei ; Yun Huang ; Yun-fei En
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
Abstract :
High power laser diodes have found wide spread applications as pump sources for solid state lasers or in direct material processing. Due to the high electrical and optical power densities in the laser structures the reliability is still questionable. We report on lifetime testing of a high power cm-bar arrays using an automated diode array reliability experiment. This computer controlled setup operates the cm-bar array 24 hours a day, and three groups of different operating condition aging test were carried on. Analysis of the aging data suggest that the extrapolated lifetime of cm-bars at 25°C can reach 7950 hours (2.86×109 shots).
Keywords :
ageing; laser materials processing; reliability; semiconductor laser arrays; aging data analysis; aging test; automated diode array reliability experiment; cm-bar extrapolated lifetime; computer controlled setup; direct material processing; high electrical densities; high power em-bar arrays; high power laser diodes; laser structures; lifetime testing; optical power densities; pump sources; solid state lasers; temperature 25 degC; time 24 hour; Abstracts; Materials; Monitoring; Reliability;
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
DOI :
10.1109/ICEPT-HDP.2012.6474801
