Title :
Photosensitivity of electron field emission from B-doped Si-tip arrays
Author :
Bornmann, B. ; Mingels, S. ; Serbun, P. ; Lützenkirchen-Hecht, D. ; Müller, G. ; Prommesberger, C. ; Langer, C. ; Dams, F. ; Schreiner, R.
Author_Institution :
FB C Phys. Dept., Univ. of Wuppertal, Wuppertal, Germany
Abstract :
The electron current from field-emitting B-doped Si-tip arrays under illumination was studied. An improved cathode design with a patch of 271 tips yielded a reproducible cathode current between 0.2-2000 nA in the electric field range of 3.8-6.6 V/μm. The plateau in the Fowler-Nordheim plot shows the actual carrier depletion and leads to a very stable emission at ~1 μA with a current noise of less than 3.3 %. Color-filtered halogen lamp illumination was used to investigate the photo-sensitivity of the saturation current. The intensity-normalized current switching ratio increases nonlinearly with the photon energy. This hints either for secondary generation in the conduction band or deeper valence band excitation. The first is supported by a rough estimation of the quantum efficiency. Further experiments with a tunable laser and electron spectroscopy are planned.
Keywords :
boron; electron field emission; electron spectroscopy; elemental semiconductors; halogens; lamps; lighting; silicon; valence bands; B-doped Si-tip arrays; Fowler-Nordheim plot; Si:B; actual carrier depletion; cathode design improvement; color-filtered halogen lamp illumination; conduction band; current 0.2 nA to 2000 nA; current noise; deeper valence band excitation; electron field emission; electron spectroscopy; intensity-normalized current switching ratio; photosensitivity; quantum efficiency; rough estimation; saturation current; tunable laser; Cathodes; Iron; Lighting; Photonics; Silicon; Spectroscopy; Switches; field emitter arrays; p-doped Si tips; photosensitivity;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
DOI :
10.1109/IVNC.2012.6316980