Title :
A study on the improvement of environment resistance in epoxy composite materials due to variation of network structure for developing out door insulator
Author :
Son, In-Hwan ; Kim, Tag-Yong ; Lee, Deok-Jin ; Kim, Kyung-Hwan ; Kim, Myung-Ho ; Kim, Jae-Hwan
Author_Institution :
Kwangwoon Univ., Seoul, South Korea
Abstract :
Epoxy resin specimens introducing the IPN method, were manufactured and then measured and compared with single network specimens as for environment resistance and tracking resistance. As a whole, ten kinds of specimens were manufactured by filler content. SEM and XRD were utilized in order to understand their structures and components. Also, Weather-O-Meter experiment and tracking resistance tests were executed to measure outdoor environment resistance. As a result of SEM and XRD tests, the variation of network structure was confirmed, and the environment resistance and tracking resistance appeared to improved
Keywords :
X-ray diffraction; composite insulators; composite materials; electric breakdown; environmental testing; epoxy insulation; epoxy insulators; filled polymers; insulation testing; radiation effects; scanning electron microscopy; AC dielectric breakdown test; IPN method; SEM; UV degradation; UV radiation resistance test; Weather-O-Meter experiment; XRD; environment resistance; epoxy composite materials; epoxy resin specimens; filler content; outdoor insulator; polymer network structure variation; tracking resistance test; Composite materials; Dielectric breakdown; Dielectrics and electrical insulation; Electrical resistance measurement; Epoxy resins; Insulation life; Manufacturing; Scanning electron microscopy; Testing; Voltage;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.616575
