A study on the improvement of environment resistance in epoxy composite materials due to variation of network structure for developing out door insulator

Author

Son, In-Hwan ; Kim, Tag-Yong ; Lee, Deok-Jin ; Kim, Kyung-Hwan ; Kim, Myung-Ho ; Kim, Jae-Hwan

Author_Institution

Kwangwoon Univ., Seoul, South Korea

Volume

2

fYear

1997

fDate

25 -30 May 1997

Firstpage

871

Abstract

Epoxy resin specimens introducing the IPN method, were manufactured and then measured and compared with single network specimens as for environment resistance and tracking resistance. As a whole, ten kinds of specimens were manufactured by filler content. SEM and XRD were utilized in order to understand their structures and components. Also, Weather-O-Meter experiment and tracking resistance tests were executed to measure outdoor environment resistance. As a result of SEM and XRD tests, the variation of network structure was confirmed, and the environment resistance and tracking resistance appeared to improved

Keywords

X-ray diffraction; composite insulators; composite materials; electric breakdown; environmental testing; epoxy insulation; epoxy insulators; filled polymers; insulation testing; radiation effects; scanning electron microscopy; AC dielectric breakdown test; IPN method; SEM; UV degradation; UV radiation resistance test; Weather-O-Meter experiment; XRD; environment resistance; epoxy composite materials; epoxy resin specimens; filler content; outdoor insulator; polymer network structure variation; tracking resistance test; Composite materials; Dielectric breakdown; Dielectrics and electrical insulation; Electrical resistance measurement; Epoxy resins; Insulation life; Manufacturing; Scanning electron microscopy; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on

Conference_Location

Seoul

Print_ISBN

0-7803-2651-2

Type

conf

DOI

10.1109/ICPADM.1997.616575

Filename

616575