Title :
Effects Of Bulk And MOCVD Thin Film Cover On The Characteristics Of Microstrip Resonators
Author :
Joshi, K.K. ; Pollard, R.D. ; Postoyalko, V.
Author_Institution :
The University of Leeds
Keywords :
Dielectric materials; Dielectric thin films; Gallium arsenide; MOCVD; Microstrip resonators; Permittivity; Q factor; Resonance; Resonant frequency; Transistors;
Conference_Titel :
Microwave Conference/Brazil, 1993., SBMO International
Print_ISBN :
0-7803-1288-0
DOI :
10.1109/SBMO.1993.587251