• DocumentCode
    3506746
  • Title

    Automated IP quality qualification for efficient system-on-chip design

  • Author

    Li-wei Wang ; Hong-wei Luo

  • Author_Institution
    Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Minist. of Ind. & Inf. Technol., Guangzhou, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1222
  • Lastpage
    1225
  • Abstract
    The robustness and reusability of Intellectual Properties (IPs) is the key to the success of the modern System on chip (SoC) designs. Therefore, it is very important to implement a rigid IP qualification platform to ensure the quality of IPs in the SoC design flow. In this paper, we propose an automated IP qualification platform, which uses XML schema technique to describe the quality model and has a layered architecture referred to the concepts from software metric theory. The experimental results on three open source IPs show that the qualification platform can not only improve accuracy of qualification results, but also accelerate the qualification process. Actually, more than 60% time savings are expected through the proposed automated IP qualification.
  • Keywords
    XML; electronic engineering computing; industrial property; logic design; system-on-chip; SoC design; XML schema technique; automated IP quality qualification; intellectual properties; software metric theory; system-on-chip design; Abstracts; Accuracy; IP networks; Qualifications; Robustness; Standards; System-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474826
  • Filename
    6474826