DocumentCode
3506765
Title
Effect of reflow time on shear property of two-step electroplated Sn-3.5Ag solder bumps
Author
Qinghua Zhao ; Jinglin Bi ; Anmin Hu ; Ming Li ; Dali Mao
Author_Institution
Inst. of Microelectron. Mater. & Technol., Shanghai Jiao Tong Univ., Shanghai, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
1226
Lastpage
1229
Abstract
In this paper, the Sn-3.5Ag solder bumps were prepared successfully by two-step electroplating method. The effect of reflow time on shear property of solder bumps and Cu was investigated. After shear tests, the shear strength of Sn-3.5Ag solder bumps peaked at the reflow time of 60s, and then decreased with further increasing reflow time. It was considered that the variation of shear strength was closely related to the interfacial microstructure between the solder and Cu. Scallop-like Cu6Sn5 intermetallic compound (IMC) formed toward solder were observed after reflowing for 30s. As the reflow time increasing, the morphology of Cu6Sn5 IMCs changed from scallop-like type to the thin, long, hexagonal and rod-like type, and the grain size of Cu6Sn5 increased. The large hexagonal rod-like weakened the interfacial connection and made part of the IMCs exposed to the fracture surface. In addition, the bumps displayed good ductility after reflowing for a short period of time, while tended to be more brittle as the reflow time increasing.
Keywords
copper alloys; electroplating; reflow soldering; silver alloys; solders; tin alloys; Cu6Sn5; Sn-Ag; interfacial connection; interfacial microstructure; reflow time effect; scallop-like intermetallic compound; scallop-like lMC; shear property; shear strength; shear tests; time 30 s; two-step electroplated solder bumps; two-step electroplating method; Abstracts; Printing; Reliability; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474827
Filename
6474827
Link To Document