Title :
Parsifal: A Generic and Configurable Fault Emulation Environment with Non-Classical Fault Models
Author :
Weinkopf, J.T. ; Harbich, Klaus ; Barke, Erich
Author_Institution :
Inst. of Microelectron. Syst., Hannover Univ.
Abstract :
Fault emulation has become an important tool for test evaluation. However, until now fault models other than the stuck-at fault model have rarely been used in emulation. In this paper, we propose non-classical fault models for emulation and a generic fault emulation environment capable of supporting these and other fault models and different emulation modes in a common support framework. Although different in logical implementation and physical abstraction level, all fault models are administered and applied together and can even be mixed in a single fault grading campaign. The proposed fault emulation environment is not restricted in its use to a certain emulator. The modular approach proposed in this paper allows an easy adaption for different emulation systems and reuse of all key components including the fault models. Those may be applied during fault grading campaigns as well as in-circuit emulation. We will present results obtained on the emulation system Mercury+ by Cadence
Keywords :
fault simulation; logic testing; Cadence; Mercury+; Parsifal; fault grading campaign; generic fault emulation; in-circuit emulation; nonclassical fault models; stuck-at fault model; test evaluation; Automotive applications; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Emulation; Hardware; Microelectronics; Software safety; System testing;
Conference_Titel :
Field Programmable Logic and Applications, 2006. FPL '06. International Conference on
Conference_Location :
Madrid
Print_ISBN :
1-4244-0312-X
DOI :
10.1109/FPL.2006.311220