DocumentCode :
3507367
Title :
Environmental reliability of nano-structured polymer-metal composite thermal interface material
Author :
Xiuzhen Lu ; Mengke Zhuang ; Lei Zhang ; Lilei Ye ; Liu, Jiangchuan
Author_Institution :
Key State Lab. for New Displays & Syst. Applic., Shanghai Univ., Shanghai, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
1326
Lastpage :
1328
Abstract :
Heat dissipation has become a `bottleneck´ for the properties of electronics products and photoelectronic devices. Thermal interface material (TIM) plays a key role in heat dissipation, and must have flexibility and high thermal conductivity in order to decrease the thermal resistance of the interface between the device and heat sink or cooler. We developed a new type of nano-TIM based electrospun technology. Metal with low melting point was injected into the polymer nanofiber scaffold fabricated by electrospun. The heat of the electronic devices dispersed through the metal, resulting in high thermal conductivity of the nano-TIM. Environmental reliability of nano-structured polymer-metal composite thermal interface material was studied by thermal cycling test. A sandwich structure was used to get shear strength of pull test. The shear strength of the samples dropped to about 50% after 500 cycles. SEM and EDS results indicate that overflow of alloy during thermal cycling test leads to decreasing shear strength.
Keywords :
X-ray chemical analysis; composite material interfaces; cooling; environmental factors; heat sinks; melting point; nanofibres; scanning electron microscopy; semiconductor device reliability; shear strength; thermal conductivity; thermal management (packaging); thermal resistance; EDS; SEM; cooler; electronics products; environmental reliability; heat dissipation; heat sink; melting point; nano-TIM based electrospun technology; nanostructured polymer-metal composite thermal interface material; photoelectronic devices; polymer nanofiber scaffold; pull test; sandwich structure; shear strength; thermal conductivity; thermal cycling test; thermal resistance; Abstracts; Metals; Nanoscale devices; Resistance heating; Roads; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474850
Filename :
6474850
Link To Document :
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