DocumentCode
3507411
Title
Accelerated test and life evaluation method of microwave tube in short vacuum tube
Author
Fang fang Song ; Yun fei En ; Sha jin Li ; Xiao Hong ; Xiao-Bao Su ; Shi-Ji Yu
Author_Institution
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Guangzhou, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
1333
Lastpage
1335
Abstract
Microwave tubes for communication must have high reliability, high power, and a long life of 10 to 15 years. Cathode as the electric source module in microwave vacuum tubes, its reliability and life directly affect the tube´s reliability and life. In this paper, electronic gun in short tubes are accelerated to evaluate the lifetime of one kind of microwave vacuum (such as traveling wave tube). In order to shorten the testing process, accelerated life-test tests method is established at higher operating temperature and currents of cathode. The highest acceleration is obtained at the cathode temperature of 1100 °Cb with the cathode current density of 1.5A/cm2. One of the most common equations used to analyze cathode lifetimes is the Arrhenius model. Lifetimes were estimated based the time at which 50% cumulative failures had occurred using OriginPro75 software.
Keywords
cathodes; life testing; microwave tubes; reliability; vacuum tubes; Arrhenius model; OriginPr075 software; accelerated life evaluation method; accelerated life-test test method; accelerated test evaluation method; cathode lifetime; electric source module; microwave tube; microwave vacuum tubes; reliability; short vacuum tube; temperature 1100 degC; time 10 year to 15 year; Acceleration; Electron tubes; Equations; Life estimation; Reliability; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474852
Filename
6474852
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