• DocumentCode
    3507411
  • Title

    Accelerated test and life evaluation method of microwave tube in short vacuum tube

  • Author

    Fang fang Song ; Yun fei En ; Sha jin Li ; Xiao Hong ; Xiao-Bao Su ; Shi-Ji Yu

  • Author_Institution
    Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Guangzhou, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1333
  • Lastpage
    1335
  • Abstract
    Microwave tubes for communication must have high reliability, high power, and a long life of 10 to 15 years. Cathode as the electric source module in microwave vacuum tubes, its reliability and life directly affect the tube´s reliability and life. In this paper, electronic gun in short tubes are accelerated to evaluate the lifetime of one kind of microwave vacuum (such as traveling wave tube). In order to shorten the testing process, accelerated life-test tests method is established at higher operating temperature and currents of cathode. The highest acceleration is obtained at the cathode temperature of 1100 °Cb with the cathode current density of 1.5A/cm2. One of the most common equations used to analyze cathode lifetimes is the Arrhenius model. Lifetimes were estimated based the time at which 50% cumulative failures had occurred using OriginPro75 software.
  • Keywords
    cathodes; life testing; microwave tubes; reliability; vacuum tubes; Arrhenius model; OriginPr075 software; accelerated life evaluation method; accelerated life-test test method; accelerated test evaluation method; cathode lifetime; electric source module; microwave tube; microwave vacuum tubes; reliability; short vacuum tube; temperature 1100 degC; time 10 year to 15 year; Acceleration; Electron tubes; Equations; Life estimation; Reliability; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474852
  • Filename
    6474852