DocumentCode
3507422
Title
Wavefront sensing for aberration modeling in fluorescence macroscopy
Author
Pankajakshan, Praveen ; Dieterlen, Alain ; Engler, Gilbert ; Kam, Zvi ; Blanc-Féraud, Laure ; Zerubia, Josiane ; Olivo-Marin, Jean-Christophe
Author_Institution
Quantitative Image, Inst. Pasteur, Paris, France
fYear
2011
fDate
March 30 2011-April 2 2011
Firstpage
905
Lastpage
908
Abstract
In this paper, we present an approach to calculate the wavefront in the back pupil plane of an objective in a fluorescent MACROscope. We use the three-dimensional image of a fluorescent bead because it contains potential pupil information in the `far´ out-of-focus planes for sensing the wavefront at the back focal plane of the objective. Wavefront sensing by phase retrieval technique is needed for several reasons. Firstly, the point-spread function of the imaging system can be calculated from the estimated pupil phase and used for image restoration. Secondly, the aberrations in the optics of the objective can be determined by studying this phase. Finally, the estimated wavefront can be used to correct the aberrated optical path without a wavefront sensor. In this paper, we estimate the wavefront of a MACROscope optical system by using Bayesian inferencing and derive the Gerchberg-Saxton algorithm as a special case.
Keywords
biomedical optical imaging; fluorescence; focal planes; image restoration; medical image processing; physiological models; wavefront sensors; Bayesian inferencing; Gerchberg-Saxton algorithm; aberrated optical path; aberration modeling; back focal plane; back pupil plane; far out-of-focus planes; fluorescence macroscopy; fluorescent bead; image restoration; phase retrieval technique; point-spread function; pupil phase; three-dimensional imaging; wavefront sensing; Adaptive optics; Microscopy; Optical diffraction; Optical imaging; Optical sensors; Bayes´ theorem; Gerchberg-Saxton algorithm; field aberration; fluorescence MACROscopy; phase retrieval;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1945-7928
Print_ISBN
978-1-4244-4127-3
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2011.5872550
Filename
5872550
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