DocumentCode :
3507680
Title :
Development of a variational Bayesian expectation maximization (VBEM) method for model inversion of multi-area E/MEG model
Author :
Babajani-Feremi, Abbas ; Jafari-Khouzani, Kourosh ; Soltanian-Zadeh, Hamid
Author_Institution :
Radiol. Dept., Henry Ford Health Syst., Detroit, MI, USA
fYear :
2011
fDate :
March 30 2011-April 2 2011
Firstpage :
964
Lastpage :
968
Abstract :
We develop and evaluate a variational Bayesian expectation maximization (VBEM) method for model inversion of our multi-area extended neural mass model (MEN) using EEG/MEG data. Parameters of MEN have suitable prior distributions that enable us to use properties of a conjugate-exponential model in implementing VBEM. Consequently, VBEM leads to analytically tractable forms that starts with initialization and consists of repeated iterations of a variational Bayesian expectation step (VB E-step) and a variational Bayesian maximization step (VB M-step). Posterior distributions of model parameters are updated in the VB M-step. Distribution of the hidden state is updated in the VB E-step using variational extended Kalman smoother. We evaluate and validate performance of VBEM method for model inversion of MEN using simulation studies in various signal-to-noise ratios. The proposed approach provides a useful technique for analyzing effective connectivity using non-invasive EEG and MEG methods.
Keywords :
belief networks; electroencephalography; expectation-maximisation algorithm; magnetoencephalography; medical computing; neurophysiology; physiological models; conjugate-exponential model; model inversion; multiarea extended neural mass model; noninvasive EEG methods; noninvasive MEG methods; signal-noise ratios; variational Bayesian expectation maximization method; variational extended Kalman smoother; Analytical models; Bayesian methods; Brain modeling; Computational modeling; Data models; Mathematical model; Signal to noise ratio; EEG; MEG; Model Inversion; Variational Bayesian Expectation Maximization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2011.5872563
Filename :
5872563
Link To Document :
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