Title :
Design and RF characteristics of traveling-wave electrodes for high-speed lithium niobate optical modulators
Author :
Yoon, Hyung Do ; Lim, Sang-kyu ; An, Chul ; Han, Young Tak ; Kim, Chang Min ; Ku, Kyung Hwan ; Lee, Han-Young
Author_Institution :
Telecommun. Components Res. Cente, Korea Electron. Technol. Inst., Kyunggi, South Korea
Abstract :
Various types of traveling-wave electrodes for a high-speed LiNbO 3 optical intensity modulator were fabricated and characterized from the viewpoints of the characteristic impedance, the effective refractive index and an attenuation constant, which were extracted from measurements in the time domain and the frequency domain. The effects of trenching the SiO2 buffer layer on electrical properties were examined. In this work the maximum value of the optical 3 dB modulation bandwidth, calculated by experimental results, was 18 GHz, and it is suggested that optical/RF phase velocity matching and the impedance matching can be achieved, and thus a higher value of the optical 3 dB modulation bandwidth can be obtained
Keywords :
electric impedance; electro-optical modulation; electrodes; high-speed optical techniques; impedance matching; integrated optics; intensity modulation; lithium compounds; optical fabrication; optical testing; refractive index; 18 GHz; LiNbO3; RF characteristics; SiO2; SiO2 buffer layer; attenuation constant; characteristic impedance; effective refractive index; electrical properties; frequency domain measurements; high-speed optical intensity modulator; high-speed optical modulators; impedance matching; optical 3 dB modulation bandwidth; optical/RF phase velocity matching; time domain measurements; traveling-wave electrodes; trenching; Bandwidth; Electrodes; High speed optical techniques; Optical attenuators; Optical buffering; Optical modulation; Optical refraction; Optical variables control; Phase modulation; Radio frequency;
Conference_Titel :
TENCON 99. Proceedings of the IEEE Region 10 Conference
Conference_Location :
Cheju Island
Print_ISBN :
0-7803-5739-6
DOI :
10.1109/TENCON.1999.818342
